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Introduction Evolution of WDS technique Basics of WDS Diffraction Crystals Detectors & Geometry Comparison of EDS and WDS Qualitative Analysis Quantitative Analysis Mapping Summary
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Crystals
There are two types of crystal
geometry in use today. In the first, called Johann geometry, the diffracting
crystal is bent to a radius of 2R, where R is the radius of the focusing
circle, called the Rowland circle (Fig. 2a). The second, called Johansson
geometry, is more precise. It has the crystal bent to radius 2R and then
ground to radius R, so that all of the points of reflection lie on the
Rowland circle (Fig. 2b). The result of this geometry is that all of the
X-rays originating from the point source on the sample are diffracted over a
greater percentage of the crystal surface and are brought to focus at the
same point on the detector, thus maximizing the collection efficiency of the
spectrometer.
Several different diffracting
crystals with different crystal lattice spacings are normally used for WDS,
in order to cover all of the wavelengths (energies) of interest, as well as
to optimize performance in the different wavelength ranges. Some of the
crystals commonly in use are listed in Table 1. Of these crystals, only the
LIF is naturally occurring. Low energy (long wavelength) X-rays require
larger d-spacing for diffraction and LSM (layered synthetic microstructure)
crystals are often used for this purpose. These pseudo-crystals are built up
by physical vapor deposition of alternating layers of heavy and light
elements. The elements are chosen to maximize scattering efficiency, and the
effective d-spacing is dictated by the thickness of the alternating layers.
Table 1:
Common diffracting crystals used for WDS
| Crystal Designation |
Crystal Type |
2d Spacing, Å |
Analyzing Range, Å
|
Analyzing Range eV |
Element Range,
Kα |
| LIF(220) |
Lithium Fluoride |
2.8473 |
0.8087 - 2.6306 |
15,330 - 4,712 |
V to Y |
| LIF(200) |
Lithium Fluoride |
4.0267 |
1.1436 - 3.7202 |
10,841 - 3,332 |
Ca to Ge |
| PET |
Pentaerythritol |
8.74 |
2.4827 - 8.0765 |
4,994 - 1,535 |
Si to Ti |
| TAP |
Thallium acid phthalate |
25.75 |
7.3130 - 23.79 |
1,695 - 521.2 |
O to Si |
| LSM-060 |
W-Si |
~61 |
~17 - ~56 |
~729 - ~221 |
C to F |
| LSM-080 |
Ni-C |
~78 |
~22 - ~72 |
~564 - ~172 |
B to O |
| LSM-200 |
Mo-B4C |
~204 |
~58 - ~190 |
~214 - ~65 |
Be and B |
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