INCA EDS Hardware

 

Achieve the correct results at any count rate
Click on the links below for more information about INCA EDS hardware
INCAx-sight

INCADryCool

 Guaranteed performance and productivity

Achieve the correct results at any count rate

Why high count rates improve your productivity  Oxford Instruments detector development timeline

INCA EDS hardware provides the most stable microanalysis platform available – guaranteed on your microscope.

For stable X-ray detection whatever the count rate:

  • INCAx-sight and INCADryCool include patented PentaFET® design with Direct Current Injection

  • INCAx-stream uses digital shaping and automatically corrects for any changes in the zero baseline

For this reason INCA is the first system which specifies just how stable the hardware will be: Between 1,000 and 10,000cps

  • Resolution will vary by less than 1eV

  • Peaks will shift by less than 1eV

(Measured at MnKα using Process Time 5)

Using a pure silicon standard INCAEnergy produces results showing no significant spurious concentrations of tantalum or tungsten at any count rate between 1,000 and 10,000 cps.

Click to see the quantitative results :

No significant spurious concentrations of tantalum or tungsten are measured at any count rate

 No significant spurious concentrations of tantalum or tungsten are measured at any count rate
Pure silicon 1,000 cps Pure silicon 2,500 cps

No significant spurious concentrations of tantalum or tungsten are measured at any count rate

 No significant spurious concentrations of tantalum or tungsten are measured at any count rate
Pure silicon 5,000 cps Pure silicon 10,000 cps

This high level of stability provides a large difference to the analyst when using INCAEnergy under real conditions. Even for spectra containing difficult overlaps, results do not change with count rate.

  • Automatic peak identification or quantitative analysis is accurate at productive count rates

  • Any differences in spectra collected at different count rates will represent real compositional variation rather than count rate distortion

  • There is no need to worry that count rate changes caused by moving to a different phase or drifting beam current will affect the accuracy of results

With INCA EDS hardware and INCAEnergy, results at 10,000cps match those achieved at 1,000cps

In these examples spectra have been collected from two materials at four different count rates.  It is obvious that there are no changes in the peak width or position at different count rates.  Also the results of standardless quantitative analysis do not vary with count rate.

Select the material: and click to see the quantitative results:

Quantitative analysis is unaffected by changes in count rate